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Thin film plastic scintillator detectors were fabricated and calibrated with x rays in the 1.5-20 keV range. The calibration systems used are described. Measurements showed that the presence of a film substrate can significantly change the detector response. X-ray conversion efficiency was determined as a function of energy and shown to be a strong function of energy for low energy x rays.
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Lyons et al. (1975) studied this question.
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