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Analytic expressions for fatigue are presented for both thin film and single crystal ferroelectric perovskite samples. The models are based on pinning of ferroelectric domain walls by oxygen vacancies oriented in planes parallel to the polarisation direction. In thin films a self-ordering effect is invoked to explain the fatigue behaviour. The thin film and single crystal expressions are qualitatively different in their temperature dependencies, but both agree with experiment.
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Dawber et al. (2001) studied this question.
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