Experimental Study on the Intrinsic Response, Optical and Electrical Parameters of 1.55-$muhboxm$DFB BH Laser Diodes During Aging Tests

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This paper reports on an investigation on the light–current, relative intensity noise, and chirp variations of life-tested InGaAsP/InP multiquantum-well buried heterostructure (BH) laser diodes (LDs). The devices have been stressed at highly accelerated aging conditions ($I = 170 hboxmA$,T = 140 ᶜirchboxCfor 3000 h). Typically, the operating current at constant output optical power(I_ op)increases logarithmically with time in stable devices while the noise resonance frequency remains stable. High-frequency RF signal-induced chirp for relative stable LDs at constant output power shows very little change with time.