New test data from the Jet Propulsion Laboratory (JPL), The Aerospace Corporation, Rockwell International (Anaheim) and IRT have been combined with published data of JPL [1,2] and Aerospace [3] to form a nearly comprehensive body of single event upset (SEU) test data for heavy ion irradiations. This data has been arranged to exhibit the SEU susceptibility of devices by function, technology and manufacturer. Clear trends emerge which should be useful in predicting future device performance.
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Nichols et al. (1985) studied this question.
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