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Experimental equipment for performing heavy-ion testing on programmable integrated circuits is presented. The equipment was used along with two different types of heavy-ion simulator to perform SEU (single-event-upset) tests on representative circuits: a dedicated Cf/sup 252/ fission decay source and an 88-in cyclotron. The observed discrepancies between the two results obtained cast doubt on the validity of using californium sources to simulate high-LET (linear-energy-transfer) particles.>
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Velazco et al. (1989) studied this question.
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