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January 1, 1988IEEE Transactions on Electron Devices

Simplified analysis of body-contact effect for MOSFET/SOI

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YŌYasuhisa ŌmuraKansai UniversityKIK. IzumiMitsubishi Electric (Japan)

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Ōmura et al. (1988) studied this question.

synapsesocial.com/papers/6a9ea0bff3ab6580739bdbd4https://doi.org/10.1109/16.2567
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