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September 25, 2026npj Materials DegradationOpen Access

Identification of key influencing factors and failure prediction for corrosion in sensitive interconnection structures of electronic devices

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BWBingqin WangJSJialiang SongZZZiheng Zhao

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Cite This Study

Wang et al. (2026) studied this question.

synapsesocial.com/papers/6ab60f69406bf401c1467f60https://doi.org/10.1038/s41529-026-00884-8
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