Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
September 30, 2025ElectronicsOpen Access

Channel Temperature Measurement of GaN HEMT Used in Kilowatt-Level Power Amplifier

View Full Paper
Ask AI
Bookmark
Share

Authors

SZSheng ZhongWFWenrao FangJZJuan Zhao

Discussion

Loading...

Member takes

Overview

This research demonstrates a method to measure channel temperature using drain current in GaN HEMTs, revealing critical insights into performance.

Key Points

  • The study reveals a new method to assess channel temperature using the drain current in GaN HEMTs under kilowatt-level operations.
  • Experimental results showed that the measured drain current values had a relative error within 1% from the theoretically derived model predictions.
  • Modifications to the gate bias circuit effectively mitigated issues caused by gate current in kW-class GaN HEMTs.
  • A significant relationship between channel temperature and drain current was established, aiding the understanding of thermal behavior in power amplifiers.

Cite This Study

Zhong et al. (2025) studied this question.

synapsesocial.com/papers/68dc1e438a7d58c25ebb24fdhttps://doi.org/10.3390/electronics14193861
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Bias Dependence of Non-Fourier Heat Spreading in GaN HEMTs2022 · 47 citations
  2. 2Measurement of Channel Temperature in GaN High-Electron Mobility Transistors2009 · 179 citations
  3. 3New pulsed measurement setup for GaN and GaAs FETs characterization2012 · 27 citations
  4. 4Modeling GaN: Powerful but Challenging2010 · 105 citations
  5. 5Stability of GaN HEMT Device Under Static and Dynamic Gate Stress2024 · 3 citations