A Summary of JPL Single Event Upset Test Data from May 1982, Through January 1984

A summary of eleven JPL tests for single event upset (SEU) performed at various accelerators, from May 1982 through January 1984, is presented. This data may be regarded as an update or follow-on to the large compilation of JPL data taken through May 1982, published in the 1983 IEEE issue of this conference. For brevity, most of the data is given for the most ionizing beam used, only. Whenever available, both cross section and LET threshold is tabulated.